Citation:
Yegon, G.K., Arusei, G.K. & Koech, R.K., 2014. MOSFET scaling to sub-micron range; analysis of characteristic curves in relation to device parameters.
Dr. Richard Koech
Lecturer
School of Science and Aerospace Studies, Department of Mathematics, Physics and Computing
Moi University, P.O Box 3900-30100, Eldoret
